Hands-on Course in Electron Microscopy - Basics and Application
In completion to the lecture on Electron microscopy 40537 the TEM techniques are applied in a hands-on course. Two TEM machines are available. The TEM/STEM Hitachi H-8110 is utilized for conventional techniques. The TEM/STEM JEOL JEM2200FS is used for spectroscopy-based methods. The course comprises the alignment of a TEM and the performance of selected TEM methods including TED, CTEM, HRTEM, STEM, EDXS, EELS, and EFTEM.
Attendance of the Lecture on Electron microscopy 40537.
P23.2 und P23.2.2
Effort, credit points; Exam / major course assessment:
4 SWS, 0 SP/ECTS (ECTS points attainable in combination with the lecture on Electron Microscopy)
Dr. Holm Kirmse, New. 15, 3´308, 7641, holm.kirmse (at) physik.hu-berlin.de
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9