2000| 2001| 2002| 2003| 2004| 2005| 2006| 2007| 2008| 2009| 2010| 2011| 2012| 2013| 2014| 2015| 2016| 2017| 2018| 2019| 2020| 2021| 2022
Impact of Si doping on dislocation behavior in MOVPE-grown AlN on high-temperature annealed AlN buffer layers
A. Mogilatenko, S. Walde, S. Hagedorn, C. Netzel, C.-Y. Huang, M. Weyers
J. Appl. Phys. 131 (2022) 045702
Stability of ZnSe-passivated laser facets cleaved in air and in ultra-high vacuum
J.E. Boschker, U. Spengler, P. Ressel, A. Mogilatenko, A. Knigge
IEEE Photonics J., vol. 14, no. 3, art. 1531606, doi:10.1109/JPHOT.2022.3176675 (2022)
High-brightness broad-area diode lasers with a novel enhanced self-aligned lateral structure
M. Elattar, O. Brox, P. Della Casa, A. Mogilatenko,A. Maaßdorf, D. Martin, H. Wenzel, A. Knigge, and P. Crump
28th International Semiconductor Laser Conference (ISLC 2022), Matsue, Japan, Oct. 16-19, ISBN: 978-4-88552-335-9, TuA-02 (2022)
Tuning metal/superconductor to insulator/superconductor coupling via control of proximity enhancement between NbSe2 monolayers
O. Chiatti, K. Mihov, T. U. Griffin C. Grosse, M. B. Alemayehu, K. Hite, D. Hamann, A. Mogilatenko, D. C. Johnson, S. F. Fischer
arxiv cond-mat.supr-con (2022)
Temperature Dependence of Dark Spot Diameters in GaN and AlGaN
C. Netzel, A. Knauer, F. Brunner,A. Mogilatenko, M. Weyers
phys. stat. sol. (b) 258 (2021) 2100358
High-Temperature Annealing and Patterned AlN/Sapphire Interfaces
S. Hagedorn, A. Mogilatenko, S. Walde, D. Pacak, J. Weinrich, C. Hartmann, and M. Weyers
phys. stat. sol. (b) 258 (2021) 2100187
Stability of ZnSe-passivated laser facets cleaved in air and in ultra-high vacuum
J.E. Boschker, U. Spengler, P. Ressel, A. Mogilatenko, A. Knigge
27th International Semiconductor Laser Conference (ISLC), ISBN 978-1-6654-4133-9, TuP3.1 (2021)
Semimetal to semiconductor transition in Bi/TiO2 core/shell nanowires
M. Kockert, R. Mitdank, H. Moon, J. Kim, A. Mogilatenko, S.H. Moosavi, M. Kroener, P. Woias, W. Lee, S.F. Fischer
Nanoscale Adv. 3 (2021) 263-271
The Impact of AlN Templates on Strain Relaxation Mechanisms during the MOVPE Growth of UVB-LED Structures
A. Knauer, A. Mogilatenko, J. Weinrich, S. Hagedorn, S. Walde, T. Kolbe, L. Cancellara, M. Weyers
Crystal Research and Technology 55 (2020) 1900215
Electrical properties and microstructure formation of V/Al-based n-contacts on high Al mole fraction n-AlGaN layers
L. Sulmoni, F. Mehnke, A. Mogilatenko, M. Guttmann, T. Wernicke, M. Kneissl
Photonics Research 8 (2020) 1381-1387
Status and Prospects of AlN Templates on Sapphire for Ultraviolet Light-Emitting Diodes
S. Hagedorn, S. Walde, A. Knauer, N. Susilo, D. Pacak, L. Cancellara, C. Netzel, A. Mogilatenko, C. Hartmann, T. Wernicke, M. Kneissl, M. Weyers
Physica Status Solidi A 217 (2020) 1901022
Improved efficiency of UVB light emitting diodes with optimized p-side
T. Kolbe, A. Knauer, J. Rass, H.K. Cho, A. Mogilatenko, S. Hagedorn, N. Lobo-Ploch, S. Einfeldt, M. Weyers
phys. stat. sol. (a) 217 (2020) 2000406
Structural and electrical properties of Pd/p-GaN contacts for GaN-based laser diodes
M. Norman-Reiner, E. Freier, A. Mogilatenko, I. Ostermay, V. Hoffmann, R. Szukiewicz, O. Krueger, D. Hommel, S. Einfeldt, M. Weyers, and G. Tränkle
Journal of Vacuum Science & Technology B 38 (2020) 032211
AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy
S. Walde, S. Hagedorn, P.M. Coulon, A. Mogilatenko, C. Netzel, J. Weinrich, N. Susilo, L. Matiwe, C. Hartmann, G. Kusch, G. Naresh-Kumar, C. Trager-Cowan, T. Wernicke, M. Bickermann, R.W. Martin, P.A. Shields, M. Kneissl, M. Weyers
Journal of Crystal Growth 531 (2020) 125343
Designing sapphire surface patterns to promote AlGaN overgrowth in hydride vapor phase epitaxy
S. Fleischmann, S. Hagedorn, A. Mogilatenko, J. Weinrich, D. Prasai, E. Richter, R.-S. Unger, M. Weyers, G. Tränkle
Semiconductor Science and Technology 35 (2020) 035028
Application of 280 nm In-Situ Metrology to study the Influence of AlN Templates on Surface Roughness and Strain Effects in UVA/UVB LEDs
K. Prince, A. Knauer, A. Mogilatenko, M. Weyers, K. Haberland
Int. Conf. on Compound Semiconductor Manufacturing Technology (CS ManTech 2020) (2020) 33-36
Crystal defect analysis in AlN layers grown by MOVPE on bulk AlN
A. Mogilatenko, A. Knauer, U. Zeimer, C. Netzel, J. Jeschke, R.-S. Unger, C. Hartmann, J. Wollweber, A. Dittmar, U. Juda, M. Weyers, M. Bickermann
Journal of Crystal Growth 505 (2019) 69-73
Extra half-plane shortening of dislocations as an origin of tensile strain in Si-doped (Al)GaN
J. Weinrich, A. Mogilatenko, F. Brunner, C.T. Koch, M. Weyers
Journal of Applied Physics 126 (2019) 085701
Influence of silicon doping on internal quantum efficiency and threshold of optically pumped deep UV AlGaN quantum well lasers
J. Jeschke, A. Mogilatenko, C. Netzel, M. Weyers
Semiconductor Science and Technology 34 (2019) 015005
Thermally stable iridium contacts to highly doped p-In0:53Ga0:47As for indium phosphide double heterojunction bipolar transistors
M. Brahem, A. Mogilatenko, D. Stoppel, D. Berger, S. Hochheim, D. Rentner, I. Ostermay, M. Reiner, S. Boppel, K. Nosaeva, N. Weimann
Microelectronic Engineering 215 (2019) 111017
Determination of sapphire off-cut and its influence on the morphology and local defect distribution in epitaxially laterally overgrown AlN for optically pumped UVC-lasers
J. Enslin, A. Knauer, A. Mogilatenko, F. Mehnke, M. Martens, Ch. Kuhn, K. Bellmann, T. Wernicke, M. Weyers, M. Kneissl
Physica Status Solidi A 216 (2019) 1900682 (1-6)
Stabilization of sputtered AlN/sapphire templates during high temperature annealing
S.Hagedorn, S. Walde, A. Mogilatenko, M. Weyers, L. Cancellara, M. Albrecht, D. Jaeger
Journal of Crystal Growth 512 (2019) 142
Influence of substrate off-cut angle on the performance of 310 nm light emitting diodes
T. Kolbe, A. Knauer, J. Enslin, S. Hagedorn, A. Mogilatenko, T. Wernicke, M. Kneissl, M. Weyers
Journal of Crystal Growth 526 (2019) 125241
Electroplated Gold Microstuds for Thermocompression Bonding of UV LED Chips
C. Stoelmacker, N. Lobo-Ploch, A. Thies, S. Hochheim, J. Rass, F. Schnieder, A. Mogilatenko, J. Ruschel, T. Kolbe, S. Knigge, S. Einfeldt
IEEE Transcations on Components, Packaging and Manufacturing Technology Vol. 9 (Issue 12) (2019) 2326-2331
Influence of quartz on silicon incorporation in HVPE grown AlN
S. Fleischmann, E. Richter, A. Mogilatenko, M. Weyers, G. Tränkle
Journal of Crystal Growth 507 (2019) 295-298
Nanometrology: Absolute Seebeck coefficient of individual silver nanowires
M. Kockert, D. Kojda, R. Mitdank, A. Mogilatenko, Z. Wang, J. Ruhhammer, M. Kroener, P. Woias, S.F. Fischer,
Scientific Reports 9 (2019) 20265
Influence of template properties and quantum well number on stimulated emission from Al0.7Ga0.3N/Al0.8Ga0.2N quantum wells
J. Jeschke, M. Martens, S. Hagedorn, K. Arne, A. Mogilatenko, H. Wenzel, U. Zeimer, J. Enslin, T. Wernicke, M. Kneissl, M. Weyers
Semiconductor Science and Technology 33 (2018) 035015
Superconductive coupling in tailored [(SnSe)1+d]m(NbSe2)1 multilayers
M. Trahms, C. Grosse, M.B. Alemayehu, O.K. Hite, O. Chiatti, A. Mogilatenko, D.C. Johnson and S.F. Fischer
Superconductor Science and Technology 31 (2018) 065006
Silicon induced defect reduction in AlN template layers for epitaxial lateral overgrowth
A. Mogilatenko, A. Knauer, U. Zeimer, C. Hartmann, H. Oppermann, M. Weyers
Journal of Crystal Growth 462 (2017) 18-23
Metamorphic Al0.5Ga0.5N:Si on AlN/sapphire for the growth of UVB LEDs
J. Enslin, F. Mehnke, A. Mogilatenko, K. Bellmann, M. Guttmann, Ch. Kuhn, J. Rass, N.L. Ploch, T. Wernicke, M. Weyers, M. Kneissl
Journal of Crystal Growth 464 (2017) 185-189
Effect of Cl2 plasma treatment and annealing on vanadium based metal contacts to Si-doped Al0.75Ga0.25N
M. Lapeyrade, S. Alame, J. Glaab, A. Mogilatenko, R.-S. Unger, Ch. Kuhn, T. Wernicke, P. Vogt, A. Knauer, U. Zeimer, S. Einfeldt, M. Weyers, M. Kneissl
Journal of Applied Physics 122 (2017) 125701
High-quality AlN grown on thermally decomposed sapphire surface
S.Hagedorn, A. Knauer, F. Brunner, A. Mogilatenko, U. Zeimer, M. Weyers
Journal of Crystal Growth 479 (2017) 16
Triangular-shaped sapphire patterning for HVPE grown AlGaN layers
S. Fleischmann, E. Richter, A. Mogilatenko, R.-S. Unger, D. Prasai, M. Weyers, G. Tränkle,
Physica Status Solidi A 214 (2017) 1600751
Influence of AlN buffer layer on subsequently grown AlGaN by HVPE
S. Fleischmann, E. Richter, A. Mogilatenko, M. Weyers, G. Tränkle,
Physica Status Solidi B 254 (2017) 1600696
Superconducting Tin Selenide/Niobium Diselenide Ferecrystals
C. Grosse, M.B. Alemayehu, A. Mogilatenko, O. Chiatti, D.C. Johnson, S.F. Fischer,
Crystal Research and Technology 52 (2017) 1700126
Defect distribution and compositional inhomogeneities in Al0.5Ga0.5N layers grown on stepped surfaces
A. Mogilatenko, A. Knauer, U. Zeimer, M. Weyers
Semiconductor Science and Technology 31 (2016) 025007
Correlation of sapphire off-cut and reduction of defect density in MOVPE grown AlN
A. Knauer, A. Mogilatenko, S. Hagedorn, J. Enslin, T. Wernicke, M. Kneissl, M. Weyers
Physica Status Solidi B 253 (2016) 809-813, DOI 10.1002/pssb.201600075
AlN growth on nano-patterned sapphire: A route for cost efficient pseudo substrates for deep UV LEDs
S. Hagedorn, A. Knauer, A. Mogilatenko, E. Richter, M. Weyers
Physica Status Solidi A 213 (2016) 3178-3185
Atomic signatures of local environment from core-level spectroscopy in beta-Ga2O3
C. Cocchi, H. Zschiesche, D. Nabok, A. Mogilatenko, M. Albrecht, Z. Galazka, H. Kirmse, C. Draxl, Ch.T. Koch
Physical Review B 94 (2016) 075147
Superconducting ferecrystals: turbostratically disordered atomic-scale layered (PbSe)1.14(NbSe2)n thin films
C. Grosse, M.B. Alemayehu, M. Falmbigl, A. Mogilatenko, O. Chiatti, D.C. Johnson, S.F. Fischer,
Scientific Reports 6 (2016) 33457
Surface effects on thermoelectric properties of metallic and semiconducting nanowires
D. Kojda, R. Mitdank, S. Weidemann, A. Mogilatenko, Z. Wang, J. Ruhhammer, M. Kröner, W. Töllner, P. Woias, K. Nielsch, S.F. Fischer,
Physica Status Solidi A 213 No. 3 (2016) 557-570
2D layered transport properties from topological insulator Bi2Se3 single crystal and micro flakes
O. Chiatti, C. Riha, D. Lawrenz, M. Busch, S. Dusari, J. Sanchez-Barriga, , L.V. Yashina, S. Valencia, A. ünal, O. Rader, S.F. Fischer,
Scientific Reports 6 (2016) 27483
V-pit to truncated pyramid transition in AlGaN-based heterostructures
A. Mogilatenko, J. Enslin, A. Knauer, F. Mehnke, K. Bellmann, T. Wernicke, M. Weyers, M. Kneissl
Semiconductor Science and Technology 30 (2015) 114010
In-situ observation and characterization of InGaN quantum well decomposition during epitaxial growth of laser diodes
V. Hoffmann, A. Mogilatenko,U. Zeimer, S. Einfeldt, M. Weyers, M. Kneissl
Crystal Research and Technology 50 (2015)499-503
Analysis of HVPE grown AlGaN layers on honeycomb patterned sapphire
S. Fleischmann, A. Mogilatenko, S. Hagedorn, E. Richter, D. Goran, P. Schäfer, U. Zeimer, M. Weyers, G. Tränkle,
Journal of Crystal Growth 414 (2015) 32-37
Spatial inhomogeneities in structural and optical properties of AlxGa1-xN quantum wells induced by surface morphology of AlN/sapphire templates
U. Zeimer, J, Jeschke, A. Mogilatenko, A. Knauer, V. Kueller, V. Hoffmann, Ch. Kuhn, F. Krüger, M. Martens, M. Kneissl, and M. Weyers
Semiconductor Science and Technology 30 (2015) 114008
High power UV-B LEDs with long lifetime
J. Rass, T. Kolbe, N.L. Ploch, T. Wernicke, F. Mehnke, Ch. Kuhn, J. Enslin, M. Guttmann, Ch. Reich, A. Mogilatenko, J. Glaab, Ch. Stoelmacker,
M. Lapeyrade, S. Einfeldt,
M. Weyers, M. Kneissl,
Proc. of SPIE Vol. 9363 (2015) 93631K-1, Gallium Nitride Materials and Devices X, edited by Jen-Inn Chyi, Hiroshi Fujioka, Hadis Morkoc
Temperature-Dependent Thermoelectric Properties of Individual Silver Nanowires
D. Kojda, R. Mitdank, M. Handwerg, A. Mogilatenko, Z. Wang, J. Ruhhammer, M. Kröner, P. Woias, S.F. Fischer,
Physical Review B 91 (2015) 024302
Controlled Pore Formation on Mesoporous Single Crystalline Silicon Nanowires: Threshold and Mechanisms
S. Weidemann, M. Kockert, D. Wallacher, M. Ramsteiner, A. Mogilatenko, K. Rademann, S.F. Fischer,
Journal of Nanomaterials 2015 (2015) 672305
Defect analysis in AlGaN layers on AlN templates obtained by epitaxial lateral overgrowth
A. Mogilatenko, V. Küller, A. Knauer, J. Jeschke, U. Zeimer, M. Weyers, G. Tränkle,
Journal of Crystal Growth 402 (2014) 222
Analysis of crystal orientation in AlN layers grown on m-plane sapphire
A. Mogilatenko, H. Kirmse, J. Stellmach, M. Frentrup, F. Mehnke, T. Wernicke, M. Kneissl and M. Weyers,
Journal of Crystal Growth 400 (2014) 54-60
Epitaxial Growth of GaN on LiAlO2 Substrates
A. Mogilatenko, chapter in K.-W. Benz and W. Neumann, "Introduction to Crystal Growth and Characterization",
Wiley-VCH, ISBN-13: 978-3-527-31840-7 (2014) pp. 392-407
Effect of heavy Ga doping on defect structure of SnO2 layers
A. Mogilatenko, H. Kirmse, O. Bierwagen, M. Schmidbauer, M-Y. Tsai, I. Häusler, M.E. White and J.S. Speck,
Physica Status Solidi (a) 211 (2014) 87
Influence of barrier growth schemes on the structural properties and thresholds of InGaN quantum well laser diodes
V. Hoffmann, A. Mogilatenko, C. Netzel, U. Zeimer, S. Einfeldt, M. Weyers,
M. Kneissl,
Journal of Crystal Growth 391 (2014) 46
Distributed Feedback Lasers in the 760 nm to 810 nm Range and Epitaxial Grating Design
O. Brox, F. Bugge, A. Mogilatenko, E. Luvsandamdin, A. Wicht, H. Wenzel, E. Goetz,
Semicond. Sci. Technol. 29 (2014) 095018
Small linewidths 76x nm DFB-laser diodes with optimised two-step epitaxial gratings
O. Brox, F. Bugge, A. Mogilatenko, E. Luvsandamdin, A. Wicht, H. Wenzel, G. Erbert,
Proc. SPIE Vol. 9134, Semicoductor Lasers and Laser Dynamics VI (2014) 91340T doi:10.1117/12.2052914
Hydride vapor-phase epitaxy of c-plane AlGaN layers on patterned sapphire substrates
E. Richter, S. Fleischmann, D. Goran, S. Hagedorn, W. John, A. Mogilatenko, D. Prasai, U. Zeimer, M. Weyers, G. Tränkle,
Journal of Electronic Materials 43 (2014) 814
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery
P. Ivo, E.M. Cho, P. Kotara, L. Schellhase, R. Lossy, U. Zeimer, A. Mogilatenko, J. Wurfl, G. Tränkle, A. Glowacki, C. Boit,
Microelectronics Reliability 54 (2014) 1288-1292
The effect of a distinct diameter variation on the thermoelectric properties of an individual Bi0.39Te0.61 Nanowire
D. Kojda, R. Mitdank, A. Mogilatenko, W. Töllner, Z. Wang, M. Kröner, P. Woias, K. Nielsch, S.F. Fischer,
Semiconductor Science and Technology 29 (2014) 124006
Origin of a-plane (Al,Ga)N formation on patterned c-plane sapphire
A. Mogilatenko,H. Kirmse, S. Hagedorn, E. Richter, U. Zeimer, M. Weyers and G. Tränkle,
Journal of Physics: Conference Series 471 (2013) 012038
Predominant growth of non-polar a-plane (Al,Ga)N on patterned c-plane sapphire by hydrogen vapor phase epitaxy
A. Mogilatenko, S. Hagedorn, E. Richter, U. Zeimer, D. Goran, M. Weyers, G. Tränkle,
Journal of Applied Physics 113 (2013) 093505
Cathodoluminescence and TEM investigations of structural and optical properties of AlGaN grown on ELO AlN/sapphire templates
U. Zeimer, A. Mogilatenko, V. Kueller, A. Knauer, M. Weyers,
Journal of Physics: Conference Series 471 (2013) 012021
Impact of AlN nucleation layer on strain in GaN grown on 4H-SiC Substrates
E. Cho, A. Mogilatenko, F. Brunner, M. Weyers,
Journal of Crystal Growth 371 (2013) 45-49
Stress evolution during AlxGa1-xN/AlN growth on sapphire
F. Brunner, A. Mogilatenko, V. Kueller, A. Knauer, M. Weyers,
Journal of Crystal Growth 376 (2013) 54-58
Electrical properties and microstructure of Vanadium-based contacts on ICP plasma etched n-type AlGaN:Si and GaN:Si surfaces
M. Lapeyrade, A. Muhin, S. Einfeldt, U. Zeimer, A. Mogilatenko, M. Weyers, M. Kneissl,
Semiconductor Science and Technology 28 (2013) 125015
High quality AlGaN grown on ELO AlN/sapphire templates
U. Zeimer, V. Kueller, A. Knauer, A. Mogilatenko, M. Weyers, M. Kneissl,
Journal of Crystal Growth 377 (2013) 32-36
In-situ etching of patterned GaAs/Ga0.5InP surfaces for highly efficient 975 nm
DFB-BA diode lasers
A. Maaßdorf , C. M. Schultz, O. Brox, H. Wenzel, P. Crump, F. Bugge, A. Mogilatenko,
G. Erbert, M. Weyers and G. Tränkle,
Journal of Crystal Growth 370 (2013) 226-229
Structural features in [(SnSe)1.15]m(TaSe2) ferecrystals – a new type of layered inter-
growth compounds
C. Grosse, R. Atkins, H. Kirmse, A. Mogilatenko, W. Neumann, D.C. Johnson
Journal of Alloys and Compounds 579 (2013) 507-515
Highly strained photovoltaic dual-channel intersubband photodetectors grown by gas-source MBE
M. Elagin, P. Schultz, M.P. Semtsiv, M. Elagin, H.Kirmse, A. Mogilatenko, T.W. Masselink,
Journal of Crystal Growth 378 (2013) 607-610
Microstructure analysis of novel ternary NiSi2-xAlx silicide layers on Si(001) formed
by solid-state reaction
A. Mogilatenko, G. Beddies, M. Falke, I. Häusler, W. Neumann,
Journal of Applied Physics 111 (2012) 103512
Analysis of doping induced wafer bow during GaN:Si growth on sapphire
F. Brunner, A. Mogilatenko, A. Knauer , M. Weyers , T. Zettler
Journal of Applied Physics 112 (2012) 033503
In-situ etched gratings embedded in AlGaAs for efficient high power 970nm
distributed feedback broad-area lasers
C.M. Schultz, P. Crump, A. Maaßdorf, O. Brox, F. Bugge, A. Mogilatenko, H. Wenzel,
S. Knigge, B. Sumpf, M. Weyers, G. Erbert and G. Tränkle,
Applied Physics Letters 100 (2012) 201115
Investigation of inversion domain formation in AlN grown on sapphire by MOVPE
V. Küller, A. Knauer, F. Brunner, A. Mogilatenko, M. Kneissl, M. Weyers,
Physica Status Solidi C 9 (2012) 496-498
Modulated epitaxial lateral overgrowth of AlN for efficient UV LEDs
V. Küller, A. Knauer, C. Reich, A. Mogilatenko, M. Weyers, J. Stellmach, T. Wernicke,
M. Kneissl, Z. Yang, C. L. Chua, N. M. Johnson,
IEEE Photonics Technology Letters 24 (2012) 1603-1605
Porous nanostructures and thermoelectric power measurement of Electro-Less Etched
black silicon
A.G. Yuan, R. Mitdank, A. Mogilatenko, S. F. Fischer,
Journal of Physical Chemistry C 116 (2012) 13767–13773
(Al,Ga)N overgrowth over AlN ridges oriented in [11-20] and [1-100] direction
V. Küller, A. Knauer, U. Zeimer, H. Rodriguez, A. Mogilatenko, M. Kneissl, M. Weyers,
Physica Status Solidi C 8 (2011) 2022-2024
Characterisation and optimization of 2-step MOVPE growth for single-mode DFB or
DBR laser diodes
F. Bugge, A. Mogilatenko, U. Zeimer, O. Brox, W. Neumann, G. Erbert, M. Weyers,
Journal of Crystal Growth 315 (2011) 74-77
Bi-modal growth and properties of self-assembled InP/InGaAs-nanowhiskers on
(001) InP by gas source MBE
M. Chashnikova, A. Mogilatenko, O. Fedosenko, V. Bryksa, A.Petrov, S. Machulik,
M.P. Semtsiv, W. Neumann, T.W. Masselink,
Journal of Crystal Growth 323 (2011) 319-322
Interplay between phase formation mechanisms and magnetism in the Sr2FeMoO6-delta metal-oxide compound
N. Kalanda, S. Demyanov, W. Masselink, A. Mogilatenko, M. Chashnikova, N. Sobolev, O. Fedosenko,
Crystal Research and Technology 46 (2011) 463-469
Advanced microstructure diagnostics and interface analysis of modern materials by
high-resolution analytical transmission electron microscopy
W. Neumann, H. Kirmse, I. Häusler, A. Mogilatenko, Ch. Zheng, W. Hetaba,
Bulletin of Polish Academy of Sciences – Technical Sciences 58 (2010) 237-253
Electron beam induced oxygen desorption in -LiAlO2
W. Hetaba, A. Mogilatenko, W. Neumann
Micron 41 (2010) 479-483
Structure investigations of nonpolar GaN layers
W. Neumann, A. Mogilatenko, T. Wernicke, E. Richter, M. Weyers, M. Kneissl
Journal of Microscopy 237 (2010) 308-313
Structural changes in nickel silicide thin films under the presence of Al and Ga
A. Mogilatenko, F. Allenstein, M.A. Schubert, M. Falke, G. Beddies, W. Neumann
Materials Science Forum 638-642 (2010) 2938-2943
Influence of AlN/(Al,Ga)N superlattices on the defect densities in UV-LEDs formed on
high-temperature AlN layers on sapphire
A. Mogilatenko, F. Brunner, A. Knauer, V. Kueller, M. Weyers and W. Neumann
Proceedings of Microscopy Conference (MC2009), Verlag der TU Graz, Vol.3 (2009) 23-24, DOI: 10.3217/978-3-85125-062-6-384
Formation of ternary nickel dislicide films with modified lattice parameters: influence
of Al and Ga
A. Mogilatenko, F. Allenstein, M.A. Schubert, M. Falke, G. Beddies, W. Neumann
Proceedings of Microscopy Conference (MC2009), Verlag der TU Graz, Vol.3 (2009) 35-36, DOI: 10.3217/978-3-85125-062-6-390
Quantitative structure analysis of nanosized materials by transmission electron
microscopy
W. Neumann, H. Kirmse, I. Häusler, Ch. Zheng, A. Mogilatenko
MRS Symp. Proc. “Electron crystallography for materials research and quantitative
characterisation of nanostructured materials” Vol. 1184 (2009) 73-84
An ELNES study of LiAlO2
W. Hetaba, A. Mogilatenko, W. Neumann, P. Schattschneider
Proceedings of Microscopy Conference (MC2009), Verlag der TU Graz, Vol. 1 (2009) 125-126, DOI: 10.3217/978-3-85125-062-6-061
Novel hedgehog-like magnetic nanostructures studied by liquid nitrogen free EDS and
aberration corrected STEM/EELS
M. Falke, A. Mogilatenko, W. Neumann, C. Brombacher, H. Rohrmann, M. Kratzer,
M. Albrecht, A. Bleloch, R. Terborg, R. Krömer, M. Rohde
Proceedings of Microscopy Conference (MC2009), Verlag der TU Graz, Vol.3 (2009) 73-74, DOI: 10.3217/978-3-85125-062-6-409
Liquid nitrogen free energy dispersive x-ray spectroscopy in TEM/STEM using silicon
drift detectors
M. Falke, A. Mogilatenko, H. Kirmse, W. Neumann, C. Brombacher, H. Rohrmann,
M. Kratzer, M. Albrecht, A. Bleloch, G. Tränkle, R. Terborg, R. Krömer, M. Rohde
Proceedings of Microscopy Conference (MC2009), Verlag der TU Graz, Vol. 1 (2009) 147-148, DOI: 10.3217/978-3-85125-062-6-072
TEM study of c-plane GaN layers grown on LiAlO2(100)
A. Mogilatenko, W. Neumann, E. Richter, M. Weyers, B. Velickov, R. Uecker
Physica Status Solidi (c) 5 (2008) 3712-3715
Influence of Ga on the Growth of NiSi2 on Si
A. Mogilatenko, F. Allenstein, M.A. Schubert, M. Falke, G. Beddies, H.-J. Hinneberg,
W. Neumann
Physica Status Solidi (c) 5 (2008) 3752-3755
Defects in m-plane GaN layers grown on (100) -LiAlO2
A. Mogilatenko, W. Neumann, T. Wernicke, E. Richter, M. Weyers, B. Velickov,
R. Uecker
Proceedings of 14th European Microscopy Congress (EMC2008), Springer-Verlag Berlin Heidelberg,
Vol. 2 (2008) 73-74, DOI: 10.1007/978-3-540-85226-1_37
Effect of the AlN nucleation layer growth on AlN material quality
O. Reentilä, F. Brunner, A. Knauer, A. Mogilatenko, W. Neumann, H. Protzmann,
M. Heuken, M. Kneissl, M. Weyers, G. Tränkle
Journal of Crystal Growth 310 (2008) 4932-4934
Computer-assisted analysis of TEM diffraction contrast images of (In,Ga)N/GaN
nanostructures
P. Manolaki, I. Häusler, H. Kirmse, A. Mogilatenko, W. Neumann, J. Smałc-
Koziorowska, C. Skierbiszewski
Physica Status Solidi (c) 5 (2008) 3732-3735
Effects of the Li-evaporation on the Czochralski growth of -LiAlO2
B. Velickov, A. Mogilatenko, R. Bertram, D. Klimm, R. Uecker, W. Neumann, R. Fornari
Journal of Crystal Growth 310 (2008) 214-220
Diffusion formation of silicide phases in Ni/Si(001) nanodimensional film system
S.I. Sidorenko, Yu. Makogon, S.M. Voloshko, O.P. Pavlova, I.E. Kotenko,
A.V. Mogilatenko, G. Beddies,
Defect and Diffusion Forum 280-281 (2008) 9-14
Mechanism of LiAlO2
decomposition during the GaN growth on (100) Y-LiAlO 2
A. Mogilatenko, W. Neumann, E. Richter, M. Weyers, B. Velickov, R. Uecker
Journal of Applied Physics 102 (2007) 023519
Growth of c-plane GaN Films on (100) Y-LiAlO2 by Hydride Vapour Phase Epitaxy
A. Mogilatenko, W. Neumann, E. Richter, M. Weyers, B. Velickov, R. Uecker
Springer Proceedings in Physics 120, Pr oc. 15th Conf. Microscopy of Semiconducting
Materials (2007) 45-48
Structural Analysis of c-plane GaN Layers Grown on (100) Y-LiAlO2
A. Mogilatenko, E. Richter, W. Neumann, M. Weyers, B. Velickov, R. Uecker
Microscopy and Microanalysis 13 (Suppl. 3) (2007) 326-327
Axiotaxy of CrSi2 on Si(001); from the Micrometer- to the Angstrom-Scale
M. Falke, H. Schletter, O. Filonenko, A. Mogilatenko, G. Beddies, S. Schulze,
M. Hietschold, A. Bleloch, K. De Keyser, C. Detavernier
Microscopy and Microanalysis 13 (Suppl. 3) (2007) 396-397
Solid-state reactions in Ni(10 nm)/C(2 nm)/Si(001) thin film system
Yu.N. Makogon, O.P. Pavlova, G. Beddies A.V. Mogilatenko, O.V. Chukhrai
Defect and Diffusion Forum 264 (2007) 155-158
Influence of annealing environment and the film thickness on the phase formation in
the Ti/Si(100) and (Ti+Si)/Si(100) thin film system
Yu. Makogon, O. Pavlova, S. Sidorenko, G. Beddies, A. Mogilatenko
Defect and Diffusion Forum 264 (2007) 159-162
Surfactant Effect of Sb on the Growth of MnSi1.7 Layers on Si(001)
A. Mogilatenko, M. Falke, H. Hortenbach, S. Teichert, G. Beddies, H.-J. Hinneberg,
Applied Surface Science 253 (2006) 561-565
The Interface Structure of Cubic Disilicides with Tuned La ttice Parameter on (001)Si Investigated by Aberra tion Corrected Dedicated STEM
M. Falke, F. Allenstein, A. Mogilatenko, G. Beddies, A. Bleloch,
Proc. of 16th International Micro scopy Congress (IMC16) (2006) Sapporo, Japan
Solid-state reactions in a thin-film Ti(1 0 nm)/Ni(10 nm)/C(2 nm) composition on
single-crystal silicon of (001) orientation at annealing in vacuum
Yu.N. Makogon, O.P. Pavlova, G. Beddies, A.V. Mogilatenko, O.V. Chukhrai,
Metallofizika i Noveishi e Tekhnologii 28 (7), pp. 913-921
Passivation of Si(001) by the Surfactant Sb and its Influence on the NiSi2 Growth
A. Mogilatenko, M. Falke, H. Hortenbach, S. Teichert, G. Beddies, H.-J. Hinneberg,
Journal of Crystal Growth 283 (2005) 303-308
Structure and magneto-optic Kerr measurements of epitaxial MnSi films on Si(111)
K. Schwinge, C. Müller, A. Mogilatenko, J. J. Paggel, and P. Fumagalli
Journal of Applied Physics 97 (2005) 103913
Influence of Al on the growth of NiSi2 on Si(001)
F. Allenstein, L. Budzinski, D. Hirsch, A. Mogilatenko, G. Beddies, R. Grötzschel,
H.-J. Hinneberg,
Microelectronic Engineering 82 (2005) 474-478
Thermostimulated mass transfer and solid-state reactions inside thin-film system of Ni (24 nm)/Ti (5 nm)/Si(001)
Beddies, G., Voloshko, S.M., Makogon, Y.M., Mogilatenko, H.V., Pavlova, O.P.,
Sidorenko, S.I., Hinneberg, H.J., Zamulko, S.O., Mishchuk, O.O.
Metallofizika i Noveishi e Tekhnologii 27 (12), pp. 1635-1643
Structure and properties of CrSi2/Si multilayers
D. Decker, E. Loos, K. Drobnievski, A. Mogilatenko, J. Schumann, G. Beddies,
H.-J. Hinneberg,
Microelectronic Engineering 76 (2004) 331-335
Influence of ultrathin templates on the epitaxial growth of CrSi2 on Si(001)
O. Filonenko, A. Mogilatenko, H. Hortenbach, F. Allenstein, G. Beddies,
H.-J. Hinneberg,
Microelectronic Engineering 76 (2004) 324-330
Epitaxial growth of CrSi2 on Si(001) by template technique
O. Filonenko, A. Mogilatenko, H. Hortenbach, F. Allenstein, G. Beddies,
H.-J. Hinneberg,
Journal of Crystal Growth 262 (2004) 281
Transmission Electron Microscopy Study of MnSi1.7 Growth on (001)Si
A. Mogilatenko, M. Falke, S. Teichert, G. Beddies, H.-J. Hinneberg,
Microscopy and Miroanalysis 9 (Suppl.3) (2003) 260-261
Surfactant Mediated Growth of MnSi1.7 Layers on (001)Si
A. Mogilatenko, M. Falke, S. Teichert, H. Hortenbach, G. Beddies, H.-J. Hinneberg,
Microelectronic Engineering Vol. 64/1-4 (2002) 211-218
Electron Microscopic Investigation of MnSi1.7 Layers on Si(001)
A. Mogilatenko, M. Falke, S. Teichert, S. Schwendler, D. K. Sarkar, H.-J. Hinneberg,
Microelectronic Engineering Vol. 60 (2002) 247-254
Epitaxial Silicide Growth on Si(001)
M. Falke, A. Mogilatenko, O. Filonenko, A. Henning, S. Teichert, G. Beddies,
H.-J. Hinneberg, C. Humphreys,
ICEM-15 Durban Proceedings 1(2002) 771-772
Growth of MnSi1.7 on Si(001) by MBE
S. Teichert, S. Schwendler, D. K. Sarkar, A. Mogilatenko, M. Falke, G. Beddies,
C. Kleint, H.-J. Hinneberg,
Journal of Crystal Growth 227-228 (2001) 882
Preparation and properties of MnSi1.7 on Si(001)
S. Teichert, D. K. Sarkar, S. Schwendler, H. Giesler, A. Mogilatenko, M. Falke,
G. Beddies, H.-J. Hinneberg,
Microelectronic Engineering 55 (2001) 227-232
Electron Microscopy Investigations of the Growth of Manganese Silicide Films on
Si(001)
A. Mogilatenko, M. Falke, S. Teichert, D. K. Sarkar, H.-J. Hinneberg,
Proc. 12th European Congress on Electron Microscopy EUREM 2000, Brno, Vol. II (2000) 293
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