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Field of Research

Major Research Areas

My research interests focus on understanding of structural properties of materials, in particular III-V semiconductors and transition metal silicides, on nanoscale. As a PostDoc at the Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik and a guest scientist in the Structure Research and Electron Microscopy Group at the Institute of Physics of Humboldt-University of Berlin I have a great opportunity to use fundamental academic materials research to influence technological application of these materials in fields of optoelectronics and electronics.

As an associated member of the group Novel Materials at Humboldt University of Berlin I have a unique opportunity to spread my research intersets on novel nanostructured materials, like topological insulators, ferecrystals, etc.

To analyse structural properties on nanoscale I use different techniques of Transmission Electron Microscopy (TEM), which are available in TEM group at the Institute of Physics, Humboldt University of Berlin.

Currently, my major research areas are:

  • Structural analysis of III-nitride-based heterostructures for UV LEDs as well as microwave and power transistors
  • Analysis of nonpolar and semipolar (Al,Ga)N buffer layers

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Next Events

Microscopy of Semiconducting Materials, MSM XX, April 9–13 2017,
Oxford, UK

The 20th Microscopy of Semiconducting Materials will take place in Oxford in 2017. The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy, X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.

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17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors, October 8–12 2017, Valladolid, Spain

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The 17th conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII) will be held in Valladolid, Spain, October 8-12, 2017. It is organized by the GdS-Optronlab group of the Condensed Matter Physics Department of the University of Valladolid. For almost 30 years, DRIP has focused on all aspects of defects in semiconductors including point, line, planar and volume defects studied by a variety of tools, emphasizing the role of characterization techniques. This comprehensive approach has allowed for a discussion of the multifaceted effects of growth, processing and device fabrication and their interrelationships, and how to approach the study of defects.

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