Electron Microscopical Techniques Available In Our Group
 

Transmission Electron Microscopy
 
  • Conventional transmission electron microscopy (CTEM)
Characterization of single- and poly-crystalline materials with respect to structural defects, shape and size of nanosized particles and inclusions
  • High-resolution transmission electron microscopy (HRTEM)
Structural characterization
Determination of local lattice distortions
Evaluation of local composition
  • Transmission electron diffraction (TED)
Determination of impurities or additional phases
Identification of nanosized particles
Analysis of the distances of lattice planes
  • Energy-dispersive X-ray spectroscopy (EDXS)
Determination of composition of areas down to 10 nm in diameter
Investigation of composition profiles across interfaces
2-dimensional imaging of composition 
  • Electron energy loss spectroscopy (EELS)
Investigation of the composition of areas down to 1 nm in diameter
Profiling of the composition across interfaces
Analysis of chemical bonding utilizing the electron loss near-edge fine structure - ELNES)
  • Energy-filtered transmission electron microscopy (EFTEM)
2-dimensional imaging of elemental distribution
  • Convergent-beam electron diffraction (CBED)
Evaluation of the lattice constants
Analysis of lattice distortion
Determination of the symmetry of the crystal lattice
Ascertainment of the thickness
  • Large-angle convergent-beam electron diffraction (LACBED)
Analysis of lattice distortion
Determination of the symmetry of the crystal lattice

Scanning electron microscopy
 
  • Secondary-electron imaging (SEM)
Imaging of the surface topography
  • Backscattered-electron imaging (BSE)
Composition sensitive imaging
  • Electron channeling pattern (ECP)
Analysis of the distribution of the orientation of grains in polycrystalline materials

Interpretation and analysis of the experimental results
 

  • HRTEM
Simulation of the image contrast using the software package Cerius, 
Digital analysis of lattice images (DALI) (Rosenauer)
  • EDXS
Numerical deconvolution of concentration profiles by means of non-commercial software
  • CBED
Simulation and analysis of higher-order laue zone lines in convergent-beam electron diffraction pattern utilizing the EMS-online software (Stadelmann) and ImageCBED (Völkl)