Electron Microscopical Techniques Available In Our Group

Transmission Electron Microscopy
  • Conventional transmission electron microscopy (CTEM)
Characterization of single- and poly-crystalline materials with respect to structural defects, shape and size of nanosized particles and inclusions
  • High-resolution transmission electron microscopy (HRTEM)
Structural characterization
Determination of local lattice distortions
Evaluation of local composition
  • Transmission electron diffraction (TED)
Determination of impurities or additional phases
Identification of nanosized particles
Analysis of the distances of lattice planes
  • Energy-dispersive X-ray spectroscopy (EDXS)
Determination of composition of areas down to 10 nm in diameter
Investigation of composition profiles across interfaces
2-dimensional imaging of composition 
  • Electron energy loss spectroscopy (EELS)
Investigation of the composition of areas down to 1 nm in diameter
Profiling of the composition across interfaces
Analysis of chemical bonding utilizing the electron loss near-edge fine structure - ELNES)
  • Energy-filtered transmission electron microscopy (EFTEM)
2-dimensional imaging of elemental distribution
  • Convergent-beam electron diffraction (CBED)
Evaluation of the lattice constants
Analysis of lattice distortion
Determination of the symmetry of the crystal lattice
Ascertainment of the thickness
  • Large-angle convergent-beam electron diffraction (LACBED)
Analysis of lattice distortion
Determination of the symmetry of the crystal lattice

Scanning electron microscopy
  • Secondary-electron imaging (SEM)
Imaging of the surface topography
  • Backscattered-electron imaging (BSE)
Composition sensitive imaging
  • Electron channeling pattern (ECP)
Analysis of the distribution of the orientation of grains in polycrystalline materials

Interpretation and analysis of the experimental results

Simulation of the image contrast using the software package Cerius, 
Digital analysis of lattice images (DALI) (Rosenauer)
  • EDXS
Numerical deconvolution of concentration profiles by means of non-commercial software
  • CBED
Simulation and analysis of higher-order laue zone lines in convergent-beam electron diffraction pattern utilizing the EMS-online software (Stadelmann) and ImageCBED (Völkl)